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Materials science
Scientific & Educational
>> Materials science Abbreviations
Look through 184 acronyms and abbreviations related to Materials science:
X-CTR
— X-Ray Crystal Truncation Rod Scattering
DSC
— Differential Scanning Calorimetry
SAED
— Selected Area Electron Diffraction
MEIS
— Medium Energy Ion Scattering
EXSY
— Exchange Spectroscopy
NOESY
— Nuclear Overhauser Effect Spectroscopy
AES
— Auger Electron Spectroscopy
AAS
— Atomic Absorption Spectroscopy
SEIRA
— Surface Enhanced Infrared Absorption Spectroscopy
DLS
— Dynamic Light Scattering
CARS
— Coherent Anti-Stokes Raman Spectroscopy
ESR
— Electron Spin Resonance
AFS
— Atomic Fluorescence Spectroscopy
CLSM
— Confocal Laser Scanning Microscopy
RIXS
— Resonant Inelastic X-ray Scattering
EPR
— Electron Paramagnetic Resonance
EBIC
— Electron Beam-induced Current
WAXS
— wide-angle X-ray scattering
TGA
— Thermogravimetric Analysis
DTA
— Differential Thermal Analysis
SEC
— Size Exclusion Chromatography
TIRFM
— Total Internal Reflection Fluorescence Microscopy
LALLS
— Low-Angle Laser Light Scattering
EDX
— Energy-Dispersive X-ray Analysis
AFM
— Atomic Force Microscopy
DLTS
— Deep-Level Transient Spectroscopy
EELS
— Electron Energy Loss Spectroscopy
CBED
— convergent beam electron diffraction patterns
ATR
— Attenuated Total Reflectance
CDI
— Coherent Diffraction Imaging
ESI-MS
— electrospray ionization mass spectrometry
SSNMR
— Solid-State Nuclear Magnetic Resonance
BRET
— Bioluminescence Resonance Energy Transfer
PAS
— Positron Annihilation Spectroscopy
ESCA
— photoelectron spectroscopy for chemical analysis
XPS
— X-Ray Photoelectron Spectroscopy
SANS
— Small-Angle Neutron Scattering
DIC
— Differential Interference Contrast
REM
— Reflection Electron Microscopy
ERT
— Electrical Resistivity Tomography
MALDI
— Matrix-assisted laser desorption/ionization
ELS
— Electrophoretic Light Scattering
FCS
— Fluorescence Correlation Spectroscopy
STM
— Scanning Tunneling Microscopy
STEM
— Storable Tubular Extendible Member
EDAX
— energy dispersive analysis of X-rays
NAA
— Neutron Activation Analysis
LEED
— Low-energy Electron Diffraction
MSF
— Materials Science Forum
ISS
— Ion Scattering Spectroscopy
SPM
— Scanning Probe Microscopy
DMA
— Dynamic Mechanical Analysis (for Elastomers)
WDX
— Wavelength Dispersive X-Ray Spectroscopy
NEXAFS
— Near-Edge X-ray Absorption Fine Structure
JMSMM
— Journal of Materials Science Materials in Medicine
XRR
— X-ray Reflectivity
JNR
— Journal of Nanoparticle Research
PES
— Photoelectron Spectroscopy
NSOM
— Near-Field Optical Microscopy
XRS
— X-ray Raman scattering
DVS
— Dynamic Vapour Sorption
PIXE
— Proton Induced X-Ray Spectroscopy
PACT
— Photoacoustic Computed Tomography
SEM
— Sionscanning Electron Microscopy
JMSP
— Journal of Materials Synthesis and Processing
CRYO-EM
— Cryo-electron microscopy
APS
— Appearance Potential Spectroscopy
JPMAT
— Journal of Porous Materials
OBIC
— Optical Beam Induced Current
PDEIS
— Potentiodynamic Electrochemical Impedance Spectroscopy
APFIM
— Atom Probe Field Ion Microscopy
ESEM
— Environmental Scanning Electron Microscopy
LEEM
— Low-energy Electron Microscopy
LC-MS
— Liquid Chromotography with Mass Spectrometry
SIMS
— Secondary Ion Mass Spectrometry
LEIS
— Low-Energy Ion-Scattering
MAAB
— Materials Application Advisory Board
EDX
— energy-dispersive X-ray spectrometry
MERL
— Materials Engineering Research Laboratory
RAMAN
— Raman Spectroscopy
MPS
— Material Processing Satellite
MFM
— Magnetic Force Microscopy
SAM
— Scanning Auger Microscopy
CL
— Cathodoluminescence
ESTM
— Electrochemical Scanning Tunneling Microscopy
MMP
— Materials and Manufacturing Processes
MCVP
— Materials Control and Verification Program
TXRF
— Total Reflection X-ray Fluorescence Analysis
XAS
— X-Ray Absorption Spectroscopy
SICM
— Scanning Ion Conductance Microscopy
XDS
— X-Ray Diffuse Scattering
MPS&P
— material processing specifications and procedures
RHEED
— Reflection High-energy Electron Diffraction
XPEEM
— X-Ray Photoelectron Emission Microscopy
SCEM
— Scanning Confocal Electron Microscopy
DHVA
— de Haas van Alphen
BIFC
— Bimolecular Fluorescence Complementation
PEELS
— Parallel Electron Energy Loss Spectroscopy
EDMR
— Electrically Detected Magnetic Resonance
SAD
— Selected Area Diffraction
AED
— Auger Electron Diffraction
SURSR
— Surface Science Reports
ECOSY
— Exclusive Correlation Spectroscopy
SRM-CE/MS
— Selected-Reaction-Monitoring Capillary-Electrophoresis Mass-Spectrometry
ECT
— Electrical Capacitance Tomography
QENS
— Quasielastic Neutron Scattering
TMA
— Thermomechanical Analysis
FIB
— Focused Ion Beam
SNOM
— Scanning Nearfield Optical Microscopy
AXRS
— Anomalous X-Ray Scattering
RAXRS
— Resonant Anomalous X-Ray Scattering
ND
— Neutron Diffraction
MCP
— Materials Chemistry and Physics
COSY
— Correlation Spectroscopy
FCCS
— fluorescence cross-correlation spectroscopy
EPMA
— Electron Probe Microanalysis
ESD
— Electron-Stimulated Desorption
EFTEM
— Energy-filtered Transmission Electron Microscopy
PCS
— Photocurrent Spectroscopy
FIM-AP
— Field Ion Microscopy - Atom Probe
CAICISS
— Coaxial Impact Collision Ion Scattering Spectroscopy
XAES
— X-Ray Induced Auger Electron Spectroscopy
ACERS
— American Ceramic Society
LOES
— Laser-Optical Emission Spectroscopy
MSTEC
— Materials Science and Technology
PAX
— Photoemission Of Adsorbed Xenon
PL
— Photo Luminescence
SAXS
— Small Angle Xray Scattering
SERS
— Surface-Enhanced Raman Spectroscopy
BSED
— Back Scattered Electron Diffraction
EXAFS
— Extended X-Ray Absorption Fine Structure
IVEM
— Intermediate Voltage Electron Microscopy
STS
— Scanning Tunneling Microscopy
NANOVID MICROSCOPY
— Nanovid Microscopy
ODNMR
— Optically Detected Magnetic Resonance
PAT
— Photoacoustic Tomography
CET
— Cryo-Electron Tomography
SE
— Spectroscopic Ellipsometry
UPS
— UV Photoelectron Spectroscopy
OES
— Optical Emission Spectroscopy
SEXAFS
— Surface Extended X-Ray Absorption Fine Structure
MWN
— Materials World Network
CV
— Cyclic Voltammetry
NDP
— Neutron Department Profiling
NDTE
— Nondestructive Testing and Evaluation
EL
— electroluminescence
MATTR
— Materials Transactions
ACPT
— Advanced Composite Products & Technology
MTA
— Microthermal Analysis
PED
— Photoelectron Diffraction
BKD
— Backscatter Kikuchi Diffraction
NIMS
— National Institute for Materials Science
MIB
— Materials and systems Institute of Bordeaux
RR
— resonance Raman
SCANIIR
— Surface Composition By Analysis Of Neutral Species And Ion-Impact Radiation
ES-MS
— electrospray mass spectrometry
PIXE
— Particle Induced X-Ray Spectroscopy
TACT
— Thermoacoustic Computed Tomography
TAT
— Thermoacoustic Tomography
PTMS
— Photothermal Microspectroscopy
ASTM
— American Society for Testing of Materials
XSW
— X-Ray Standing Wave Technique
NIS
— Nuclear Inelastic Scattering
FEM
— Field-Emission Microscopy
MAB
— Materials Advisory Board
NDTE
— Nondestructive Test Equipment
EID
— Electron-Induced Desorption
VEDIC
— Video-Enhanced Differential Interference Contrast Microscopy
MSENG
— Materials Science and Engineering
PC
— Photocurrent
MAB
— Materials Applications Board
SURIA
— Surface and Interface Analysis
SNMS
— Sputtered Neutral Species Mass Spectroscopy
SMW
— Standard Materials Worksheet
NMAB
— National Materials Advisory Board
WDS
— Wavelength-Dispersive Spectroscopy
IRS
— Infrared Spectroscopy
LIBS
— Laser-Induced Breakdown Spectroscopy
SURVL
— Surface Reviews and Letters
KIM
— Korean Institute of Metals and Materials
PD
— Photodesorption
CCM
— Charge Collection Microscopy
VEM
— Viscoelastic Material
SMPM
— Structural Materials Property Manual
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