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Materials science
Scientific & Educational
>> Materials science Abbreviations
Look through 184 acronyms and abbreviations related to Materials science:
X-CTR
— X-Ray Crystal Truncation Rod Scattering
DSC
— Differential Scanning Calorimetry
SAED
— Selected Area Electron Diffraction
MEIS
— Medium Energy Ion Scattering
EXSY
— Exchange Spectroscopy
AES
— Auger Electron Spectroscopy
NOESY
— Nuclear Overhauser Effect Spectroscopy
AAS
— Atomic Absorption Spectroscopy
DLS
— Dynamic Light Scattering
AFS
— Atomic Fluorescence Spectroscopy
ESR
— Electron Spin Resonance
CARS
— Coherent Anti-Stokes Raman Spectroscopy
SEIRA
— Surface Enhanced Infrared Absorption Spectroscopy
EPR
— Electron Paramagnetic Resonance
CLSM
— Confocal Laser Scanning Microscopy
RIXS
— Resonant Inelastic X-ray Scattering
DTA
— Differential Thermal Analysis
AFM
— Atomic Force Microscopy
EBIC
— Electron Beam-induced Current
EDX
— Energy-Dispersive X-ray Analysis
REM
— Reflection Electron Microscopy
WAXS
— wide-angle X-ray scattering
LALLS
— Low-Angle Laser Light Scattering
SEC
— Size Exclusion Chromatography
TGA
— Thermogravimetric Analysis
DLTS
— Deep-Level Transient Spectroscopy
ESI-MS
— electrospray ionization mass spectrometry
EELS
— Electron Energy Loss Spectroscopy
ATR
— Attenuated Total Reflectance
SSNMR
— Solid-State Nuclear Magnetic Resonance
TIRFM
— Total Internal Reflection Fluorescence Microscopy
ESCA
— photoelectron spectroscopy for chemical analysis
PAS
— Positron Annihilation Spectroscopy
XPS
— X-Ray Photoelectron Spectroscopy
FCS
— Fluorescence Correlation Spectroscopy
CDI
— Coherent Diffraction Imaging
STM
— Scanning Tunneling Microscopy
CBED
— convergent beam electron diffraction patterns
ERT
— Electrical Resistivity Tomography
SANS
— Small-Angle Neutron Scattering
STEM
— Storable Tubular Extendible Member
MALDI
— Matrix-assisted laser desorption/ionization
NAA
— Neutron Activation Analysis
BRET
— Bioluminescence Resonance Energy Transfer
EDAX
— energy dispersive analysis of X-rays
MSF
— Materials Science Forum
ELS
— Electrophoretic Light Scattering
DIC
— Differential Interference Contrast
XRR
— X-ray Reflectivity
JMSMM
— Journal of Materials Science Materials in Medicine
JMSP
— Journal of Materials Synthesis and Processing
ISS
— Ion Scattering Spectroscopy
LEED
— Low-energy Electron Diffraction
PES
— Photoelectron Spectroscopy
NEXAFS
— Near-Edge X-ray Absorption Fine Structure
JNR
— Journal of Nanoparticle Research
DMA
— Dynamic Mechanical Analysis (for Elastomers)
LC-MS
— Liquid Chromotography with Mass Spectrometry
JPMAT
— Journal of Porous Materials
EDX
— energy-dispersive X-ray spectrometry
WDX
— Wavelength Dispersive X-Ray Spectroscopy
SIMS
— Secondary Ion Mass Spectrometry
SPM
— Scanning Probe Microscopy
PDEIS
— Potentiodynamic Electrochemical Impedance Spectroscopy
APS
— Appearance Potential Spectroscopy
PACT
— Photoacoustic Computed Tomography
MERL
— Materials Engineering Research Laboratory
XRS
— X-ray Raman scattering
NSOM
— Near-Field Optical Microscopy
ESEM
— Environmental Scanning Electron Microscopy
MAAB
— Materials Application Advisory Board
SEM
— Sionscanning Electron Microscopy
DVS
— Dynamic Vapour Sorption
MPS&P
— material processing specifications and procedures
MCVP
— Materials Control and Verification Program
PIXE
— Proton Induced X-Ray Spectroscopy
CRYO-EM
— Cryo-electron microscopy
OBIC
— Optical Beam Induced Current
APFIM
— Atom Probe Field Ion Microscopy
LEEM
— Low-energy Electron Microscopy
RAMAN
— Raman Spectroscopy
LEIS
— Low-Energy Ion-Scattering
SAM
— Scanning Auger Microscopy
ESTM
— Electrochemical Scanning Tunneling Microscopy
XAS
— X-Ray Absorption Spectroscopy
MFM
— Magnetic Force Microscopy
RHEED
— Reflection High-energy Electron Diffraction
TXRF
— Total Reflection X-ray Fluorescence Analysis
XPEEM
— X-Ray Photoelectron Emission Microscopy
MPS
— Material Processing Satellite
BIFC
— Bimolecular Fluorescence Complementation
DHVA
— de Haas van Alphen
SCEM
— Scanning Confocal Electron Microscopy
XDS
— X-Ray Diffuse Scattering
MMP
— Materials and Manufacturing Processes
AXRS
— Anomalous X-Ray Scattering
AED
— Auger Electron Diffraction
CL
— Cathodoluminescence
EDMR
— Electrically Detected Magnetic Resonance
SICM
— Scanning Ion Conductance Microscopy
SRM-CE/MS
— Selected-Reaction-Monitoring Capillary-Electrophoresis Mass-Spectrometry
SURSR
— Surface Science Reports
EFTEM
— Energy-filtered Transmission Electron Microscopy
PEELS
— Parallel Electron Energy Loss Spectroscopy
SAD
— Selected Area Diffraction
ECT
— Electrical Capacitance Tomography
ECOSY
— Exclusive Correlation Spectroscopy
FIB
— Focused Ion Beam
EXAFS
— Extended X-Ray Absorption Fine Structure
PCS
— Photocurrent Spectroscopy
RAXRS
— Resonant Anomalous X-Ray Scattering
XAES
— X-Ray Induced Auger Electron Spectroscopy
ACERS
— American Ceramic Society
FIM-AP
— Field Ion Microscopy - Atom Probe
ESD
— Electron-Stimulated Desorption
EPMA
— Electron Probe Microanalysis
COSY
— Correlation Spectroscopy
FCCS
— fluorescence cross-correlation spectroscopy
QENS
— Quasielastic Neutron Scattering
MSTEC
— Materials Science and Technology
BSED
— Back Scattered Electron Diffraction
SNOM
— Scanning Nearfield Optical Microscopy
MCP
— Materials Chemistry and Physics
CAICISS
— Coaxial Impact Collision Ion Scattering Spectroscopy
ND
— Neutron Diffraction
TMA
— Thermomechanical Analysis
LOES
— Laser-Optical Emission Spectroscopy
SERS
— Surface-Enhanced Raman Spectroscopy
NANOVID MICROSCOPY
— Nanovid Microscopy
PAX
— Photoemission Of Adsorbed Xenon
BKD
— Backscatter Kikuchi Diffraction
IVEM
— Intermediate Voltage Electron Microscopy
SAXS
— Small Angle Xray Scattering
PL
— Photo Luminescence
STS
— Scanning Tunneling Microscopy
ACPT
— Advanced Composite Products & Technology
SE
— Spectroscopic Ellipsometry
ES-MS
— electrospray mass spectrometry
SEXAFS
— Surface Extended X-Ray Absorption Fine Structure
OES
— Optical Emission Spectroscopy
NDTE
— Nondestructive Testing and Evaluation
CET
— Cryo-Electron Tomography
ODNMR
— Optically Detected Magnetic Resonance
MWN
— Materials World Network
MATTR
— Materials Transactions
PAT
— Photoacoustic Tomography
NIMS
— National Institute for Materials Science
CV
— Cyclic Voltammetry
TACT
— Thermoacoustic Computed Tomography
UPS
— UV Photoelectron Spectroscopy
SCANIIR
— Surface Composition By Analysis Of Neutral Species And Ion-Impact Radiation
EID
— Electron-Induced Desorption
MIB
— Materials and systems Institute of Bordeaux
EL
— electroluminescence
MSENG
— Materials Science and Engineering
NDP
— Neutron Department Profiling
XSW
— X-Ray Standing Wave Technique
ASTM
— American Society for Testing of Materials
PED
— Photoelectron Diffraction
PIXE
— Particle Induced X-Ray Spectroscopy
RR
— resonance Raman
SURIA
— Surface and Interface Analysis
LIBS
— Laser-Induced Breakdown Spectroscopy
IRS
— Infrared Spectroscopy
NIS
— Nuclear Inelastic Scattering
NDTE
— Nondestructive Test Equipment
VEDIC
— Video-Enhanced Differential Interference Contrast Microscopy
SURVL
— Surface Reviews and Letters
MAB
— Materials Advisory Board
PTMS
— Photothermal Microspectroscopy
SNMS
— Sputtered Neutral Species Mass Spectroscopy
FEM
— Field-Emission Microscopy
TAT
— Thermoacoustic Tomography
MTA
— Microthermal Analysis
MAB
— Materials Applications Board
PC
— Photocurrent
VEM
— Viscoelastic Material
CCM
— Charge Collection Microscopy
NMAB
— National Materials Advisory Board
KIM
— Korean Institute of Metals and Materials
SMPM
— Structural Materials Property Manual
SMW
— Standard Materials Worksheet
WDS
— Wavelength-Dispersive Spectroscopy
PD
— Photodesorption
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