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Materials science
Scientific & Educational
>> Materials science Abbreviations
Look through 184 acronyms and abbreviations related to Materials science:
MEIS
— Medium Energy Ion Scattering
DSC
— Differential Scanning Calorimetry
X-CTR
— X-Ray Crystal Truncation Rod Scattering
SAED
— Selected Area Electron Diffraction
AAS
— Atomic Absorption Spectroscopy
AES
— Auger Electron Spectroscopy
TIRFM
— Total Internal Reflection Fluorescence Microscopy
SEC
— Size Exclusion Chromatography
EBIC
— Electron Beam-induced Current
EXSY
— Exchange Spectroscopy
ESR
— Electron Spin Resonance
CBED
— convergent beam electron diffraction patterns
BRET
— Bioluminescence Resonance Energy Transfer
EPR
— Electron Paramagnetic Resonance
SEIRA
— Surface Enhanced Infrared Absorption Spectroscopy
LALLS
— Low-Angle Laser Light Scattering
TGA
— Thermogravimetric Analysis
CARS
— Coherent Anti-Stokes Raman Spectroscopy
ATR
— Attenuated Total Reflectance
DLS
— Dynamic Light Scattering
NOESY
— Nuclear Overhauser Effect Spectroscopy
AFM
— Atomic Force Microscopy
SPM
— Scanning Probe Microscopy
RIXS
— Resonant Inelastic X-ray Scattering
CDI
— Coherent Diffraction Imaging
XPS
— X-Ray Photoelectron Spectroscopy
ERT
— Electrical Resistivity Tomography
DTA
— Differential Thermal Analysis
AFS
— Atomic Fluorescence Spectroscopy
DIC
— Differential Interference Contrast
MFM
— Magnetic Force Microscopy
EDAX
— energy dispersive analysis of X-rays
DVS
— Dynamic Vapour Sorption
NEXAFS
— Near-Edge X-ray Absorption Fine Structure
SSNMR
— Solid-State Nuclear Magnetic Resonance
CRYO-EM
— Cryo-electron microscopy
WAXS
— wide-angle X-ray scattering
MPS
— Material Processing Satellite
PACT
— Photoacoustic Computed Tomography
EELS
— Electron Energy Loss Spectroscopy
ELS
— Electrophoretic Light Scattering
ESCA
— photoelectron spectroscopy for chemical analysis
FCS
— Fluorescence Correlation Spectroscopy
APS
— Appearance Potential Spectroscopy
PAS
— Positron Annihilation Spectroscopy
CL
— Cathodoluminescence
CLSM
— Confocal Laser Scanning Microscopy
OBIC
— Optical Beam Induced Current
STEM
— Storable Tubular Extendible Member
SAD
— Selected Area Diffraction
APFIM
— Atom Probe Field Ion Microscopy
STM
— Scanning Tunneling Microscopy
EDX
— Energy-Dispersive X-ray Analysis
LEED
— Low-energy Electron Diffraction
NAA
— Neutron Activation Analysis
SAM
— Scanning Auger Microscopy
MSF
— Materials Science Forum
AED
— Auger Electron Diffraction
TMA
— Thermomechanical Analysis
WDX
— Wavelength Dispersive X-Ray Spectroscopy
JMSMM
— Journal of Materials Science Materials in Medicine
ISS
— Ion Scattering Spectroscopy
PIXE
— Proton Induced X-Ray Spectroscopy
JNR
— Journal of Nanoparticle Research
PES
— Photoelectron Spectroscopy
JPMAT
— Journal of Porous Materials
NSOM
— Near-Field Optical Microscopy
MALDI
— Matrix-assisted laser desorption/ionization
DHVA
— de Haas van Alphen
JMSP
— Journal of Materials Synthesis and Processing
MERL
— Materials Engineering Research Laboratory
XRR
— X-ray Reflectivity
SANS
— Small-Angle Neutron Scattering
PDEIS
— Potentiodynamic Electrochemical Impedance Spectroscopy
FCCS
— fluorescence cross-correlation spectroscopy
SEM
— Sionscanning Electron Microscopy
LEEM
— Low-energy Electron Microscopy
ESTM
— Electrochemical Scanning Tunneling Microscopy
SIMS
— Secondary Ion Mass Spectrometry
MAAB
— Materials Application Advisory Board
DMA
— Dynamic Mechanical Analysis (for Elastomers)
LC-MS
— Liquid Chromotography with Mass Spectrometry
MCVP
— Materials Control and Verification Program
SURSR
— Surface Science Reports
ESD
— Electron-Stimulated Desorption
SICM
— Scanning Ion Conductance Microscopy
BIFC
— Bimolecular Fluorescence Complementation
EPMA
— Electron Probe Microanalysis
MCP
— Materials Chemistry and Physics
XAS
— X-Ray Absorption Spectroscopy
CAICISS
— Coaxial Impact Collision Ion Scattering Spectroscopy
COSY
— Correlation Spectroscopy
PAX
— Photoemission Of Adsorbed Xenon
TXRF
— Total Reflection X-ray Fluorescence Analysis
DLTS
— Deep-Level Transient Spectroscopy
MPS&P
— material processing specifications and procedures
CV
— Cyclic Voltammetry
RAMAN
— Raman Spectroscopy
NANOVID MICROSCOPY
— Nanovid Microscopy
ESI-MS
— electrospray ionization mass spectrometry
ODNMR
— Optically Detected Magnetic Resonance
SERS
— Surface-Enhanced Raman Spectroscopy
EXAFS
— Extended X-Ray Absorption Fine Structure
OES
— Optical Emission Spectroscopy
EDX
— energy-dispersive X-ray spectrometry
ND
— Neutron Diffraction
FIM-AP
— Field Ion Microscopy - Atom Probe
SE
— Spectroscopic Ellipsometry
ACERS
— American Ceramic Society
RR
— resonance Raman
XPEEM
— X-Ray Photoelectron Emission Microscopy
XDS
— X-Ray Diffuse Scattering
XAES
— X-Ray Induced Auger Electron Spectroscopy
SRM-CE/MS
— Selected-Reaction-Monitoring Capillary-Electrophoresis Mass-Spectrometry
RAXRS
— Resonant Anomalous X-Ray Scattering
EL
— electroluminescence
PL
— Photo Luminescence
PEELS
— Parallel Electron Energy Loss Spectroscopy
MMP
— Materials and Manufacturing Processes
SNOM
— Scanning Nearfield Optical Microscopy
AXRS
— Anomalous X-Ray Scattering
EDMR
— Electrically Detected Magnetic Resonance
MSTEC
— Materials Science and Technology
PAT
— Photoacoustic Tomography
SCEM
— Scanning Confocal Electron Microscopy
FIB
— Focused Ion Beam
LOES
— Laser-Optical Emission Spectroscopy
LEIS
— Low-Energy Ion-Scattering
UPS
— UV Photoelectron Spectroscopy
XRS
— X-ray Raman scattering
BSED
— Back Scattered Electron Diffraction
IVEM
— Intermediate Voltage Electron Microscopy
STS
— Scanning Tunneling Microscopy
ECT
— Electrical Capacitance Tomography
QENS
— Quasielastic Neutron Scattering
PED
— Photoelectron Diffraction
ACPT
— Advanced Composite Products & Technology
NIMS
— National Institute for Materials Science
SAXS
— Small Angle Xray Scattering
PCS
— Photocurrent Spectroscopy
ASTM
— American Society for Testing of Materials
MAB
— Materials Advisory Board
SCANIIR
— Surface Composition By Analysis Of Neutral Species And Ion-Impact Radiation
MAB
— Materials Applications Board
CET
— Cryo-Electron Tomography
MATTR
— Materials Transactions
MIB
— Materials and systems Institute of Bordeaux
SMW
— Standard Materials Worksheet
BKD
— Backscatter Kikuchi Diffraction
PTMS
— Photothermal Microspectroscopy
TACT
— Thermoacoustic Computed Tomography
LIBS
— Laser-Induced Breakdown Spectroscopy
XSW
— X-Ray Standing Wave Technique
NDTE
— Nondestructive Testing and Evaluation
EID
— Electron-Induced Desorption
MTA
— Microthermal Analysis
NDTE
— Nondestructive Test Equipment
PIXE
— Particle Induced X-Ray Spectroscopy
SEXAFS
— Surface Extended X-Ray Absorption Fine Structure
ECOSY
— Exclusive Correlation Spectroscopy
WDS
— Wavelength-Dispersive Spectroscopy
IRS
— Infrared Spectroscopy
NIS
— Nuclear Inelastic Scattering
REM
— Reflection Electron Microscopy
FEM
— Field-Emission Microscopy
MWN
— Materials World Network
KIM
— Korean Institute of Metals and Materials
MSENG
— Materials Science and Engineering
SNMS
— Sputtered Neutral Species Mass Spectroscopy
PC
— Photocurrent
SURIA
— Surface and Interface Analysis
NMAB
— National Materials Advisory Board
TAT
— Thermoacoustic Tomography
ES-MS
— electrospray mass spectrometry
VEDIC
— Video-Enhanced Differential Interference Contrast Microscopy
NDP
— Neutron Department Profiling
VEM
— Viscoelastic Material
RHEED
— Reflection High-energy Electron Diffraction
PD
— Photodesorption
SMPM
— Structural Materials Property Manual
SURVL
— Surface Reviews and Letters
EFTEM
— Energy-filtered Transmission Electron Microscopy
CCM
— Charge Collection Microscopy
ESEM
— Environmental Scanning Electron Microscopy
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