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Materials science
Scientific & Educational
>> Materials science Abbreviations
Look through 184 acronyms and abbreviations related to Materials science:
X-CTR
— X-Ray Crystal Truncation Rod Scattering
DSC
— Differential Scanning Calorimetry
SAED
— Selected Area Electron Diffraction
MEIS
— Medium Energy Ion Scattering
EXSY
— Exchange Spectroscopy
AES
— Auger Electron Spectroscopy
NOESY
— Nuclear Overhauser Effect Spectroscopy
AAS
— Atomic Absorption Spectroscopy
DLS
— Dynamic Light Scattering
AFS
— Atomic Fluorescence Spectroscopy
ESR
— Electron Spin Resonance
CARS
— Coherent Anti-Stokes Raman Spectroscopy
SEIRA
— Surface Enhanced Infrared Absorption Spectroscopy
EPR
— Electron Paramagnetic Resonance
CLSM
— Confocal Laser Scanning Microscopy
RIXS
— Resonant Inelastic X-ray Scattering
AFM
— Atomic Force Microscopy
DTA
— Differential Thermal Analysis
EBIC
— Electron Beam-induced Current
EDX
— Energy-Dispersive X-ray Analysis
REM
— Reflection Electron Microscopy
WAXS
— wide-angle X-ray scattering
LALLS
— Low-Angle Laser Light Scattering
DLTS
— Deep-Level Transient Spectroscopy
SEC
— Size Exclusion Chromatography
TGA
— Thermogravimetric Analysis
ESI-MS
— electrospray ionization mass spectrometry
EELS
— Electron Energy Loss Spectroscopy
ATR
— Attenuated Total Reflectance
SSNMR
— Solid-State Nuclear Magnetic Resonance
TIRFM
— Total Internal Reflection Fluorescence Microscopy
ESCA
— photoelectron spectroscopy for chemical analysis
FCS
— Fluorescence Correlation Spectroscopy
PAS
— Positron Annihilation Spectroscopy
XPS
— X-Ray Photoelectron Spectroscopy
STM
— Scanning Tunneling Microscopy
CDI
— Coherent Diffraction Imaging
CBED
— convergent beam electron diffraction patterns
ERT
— Electrical Resistivity Tomography
SANS
— Small-Angle Neutron Scattering
MALDI
— Matrix-assisted laser desorption/ionization
STEM
— Storable Tubular Extendible Member
MSF
— Materials Science Forum
NAA
— Neutron Activation Analysis
BRET
— Bioluminescence Resonance Energy Transfer
EDAX
— energy dispersive analysis of X-rays
ELS
— Electrophoretic Light Scattering
DIC
— Differential Interference Contrast
XRR
— X-ray Reflectivity
JMSMM
— Journal of Materials Science Materials in Medicine
JMSP
— Journal of Materials Synthesis and Processing
ISS
— Ion Scattering Spectroscopy
PES
— Photoelectron Spectroscopy
LEED
— Low-energy Electron Diffraction
JNR
— Journal of Nanoparticle Research
NEXAFS
— Near-Edge X-ray Absorption Fine Structure
DMA
— Dynamic Mechanical Analysis (for Elastomers)
LC-MS
— Liquid Chromotography with Mass Spectrometry
JPMAT
— Journal of Porous Materials
EDX
— energy-dispersive X-ray spectrometry
WDX
— Wavelength Dispersive X-Ray Spectroscopy
APS
— Appearance Potential Spectroscopy
SIMS
— Secondary Ion Mass Spectrometry
PDEIS
— Potentiodynamic Electrochemical Impedance Spectroscopy
SPM
— Scanning Probe Microscopy
MERL
— Materials Engineering Research Laboratory
PACT
— Photoacoustic Computed Tomography
XRS
— X-ray Raman scattering
NSOM
— Near-Field Optical Microscopy
ESEM
— Environmental Scanning Electron Microscopy
MAAB
— Materials Application Advisory Board
MPS&P
— material processing specifications and procedures
DVS
— Dynamic Vapour Sorption
SEM
— Sionscanning Electron Microscopy
MCVP
— Materials Control and Verification Program
PIXE
— Proton Induced X-Ray Spectroscopy
CRYO-EM
— Cryo-electron microscopy
OBIC
— Optical Beam Induced Current
APFIM
— Atom Probe Field Ion Microscopy
LEEM
— Low-energy Electron Microscopy
RAMAN
— Raman Spectroscopy
LEIS
— Low-Energy Ion-Scattering
ESTM
— Electrochemical Scanning Tunneling Microscopy
SAM
— Scanning Auger Microscopy
MFM
— Magnetic Force Microscopy
XAS
— X-Ray Absorption Spectroscopy
TXRF
— Total Reflection X-ray Fluorescence Analysis
RHEED
— Reflection High-energy Electron Diffraction
XPEEM
— X-Ray Photoelectron Emission Microscopy
DHVA
— de Haas van Alphen
SCEM
— Scanning Confocal Electron Microscopy
MPS
— Material Processing Satellite
BIFC
— Bimolecular Fluorescence Complementation
AXRS
— Anomalous X-Ray Scattering
XDS
— X-Ray Diffuse Scattering
MMP
— Materials and Manufacturing Processes
AED
— Auger Electron Diffraction
CL
— Cathodoluminescence
EDMR
— Electrically Detected Magnetic Resonance
SICM
— Scanning Ion Conductance Microscopy
SRM-CE/MS
— Selected-Reaction-Monitoring Capillary-Electrophoresis Mass-Spectrometry
SURSR
— Surface Science Reports
EFTEM
— Energy-filtered Transmission Electron Microscopy
SAD
— Selected Area Diffraction
PEELS
— Parallel Electron Energy Loss Spectroscopy
ECT
— Electrical Capacitance Tomography
ECOSY
— Exclusive Correlation Spectroscopy
FIB
— Focused Ion Beam
EXAFS
— Extended X-Ray Absorption Fine Structure
RAXRS
— Resonant Anomalous X-Ray Scattering
XAES
— X-Ray Induced Auger Electron Spectroscopy
ACERS
— American Ceramic Society
PCS
— Photocurrent Spectroscopy
FIM-AP
— Field Ion Microscopy - Atom Probe
EPMA
— Electron Probe Microanalysis
ESD
— Electron-Stimulated Desorption
FCCS
— fluorescence cross-correlation spectroscopy
MSTEC
— Materials Science and Technology
COSY
— Correlation Spectroscopy
QENS
— Quasielastic Neutron Scattering
BSED
— Back Scattered Electron Diffraction
SNOM
— Scanning Nearfield Optical Microscopy
TMA
— Thermomechanical Analysis
MCP
— Materials Chemistry and Physics
CAICISS
— Coaxial Impact Collision Ion Scattering Spectroscopy
ND
— Neutron Diffraction
NANOVID MICROSCOPY
— Nanovid Microscopy
LOES
— Laser-Optical Emission Spectroscopy
SERS
— Surface-Enhanced Raman Spectroscopy
IVEM
— Intermediate Voltage Electron Microscopy
STS
— Scanning Tunneling Microscopy
PAX
— Photoemission Of Adsorbed Xenon
BKD
— Backscatter Kikuchi Diffraction
SAXS
— Small Angle Xray Scattering
PL
— Photo Luminescence
ACPT
— Advanced Composite Products & Technology
ES-MS
— electrospray mass spectrometry
OES
— Optical Emission Spectroscopy
SE
— Spectroscopic Ellipsometry
SEXAFS
— Surface Extended X-Ray Absorption Fine Structure
ODNMR
— Optically Detected Magnetic Resonance
NDTE
— Nondestructive Testing and Evaluation
CET
— Cryo-Electron Tomography
MWN
— Materials World Network
MATTR
— Materials Transactions
PAT
— Photoacoustic Tomography
NIMS
— National Institute for Materials Science
TACT
— Thermoacoustic Computed Tomography
CV
— Cyclic Voltammetry
UPS
— UV Photoelectron Spectroscopy
PED
— Photoelectron Diffraction
EID
— Electron-Induced Desorption
SCANIIR
— Surface Composition By Analysis Of Neutral Species And Ion-Impact Radiation
MSENG
— Materials Science and Engineering
MIB
— Materials and systems Institute of Bordeaux
EL
— electroluminescence
RR
— resonance Raman
NDP
— Neutron Department Profiling
SURIA
— Surface and Interface Analysis
IRS
— Infrared Spectroscopy
XSW
— X-Ray Standing Wave Technique
ASTM
— American Society for Testing of Materials
PIXE
— Particle Induced X-Ray Spectroscopy
SURVL
— Surface Reviews and Letters
NIS
— Nuclear Inelastic Scattering
LIBS
— Laser-Induced Breakdown Spectroscopy
MAB
— Materials Advisory Board
NDTE
— Nondestructive Test Equipment
VEDIC
— Video-Enhanced Differential Interference Contrast Microscopy
MTA
— Microthermal Analysis
FEM
— Field-Emission Microscopy
PTMS
— Photothermal Microspectroscopy
SNMS
— Sputtered Neutral Species Mass Spectroscopy
VEM
— Viscoelastic Material
PC
— Photocurrent
TAT
— Thermoacoustic Tomography
MAB
— Materials Applications Board
CCM
— Charge Collection Microscopy
NMAB
— National Materials Advisory Board
KIM
— Korean Institute of Metals and Materials
SMPM
— Structural Materials Property Manual
WDS
— Wavelength-Dispersive Spectroscopy
SMW
— Standard Materials Worksheet
PD
— Photodesorption
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