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Materials science
Scientific & Educational
>> Materials science Abbreviations
Look through 184 acronyms and abbreviations related to Materials science:
MEIS
— Medium Energy Ion Scattering
X-CTR
— X-Ray Crystal Truncation Rod Scattering
DSC
— Differential Scanning Calorimetry
SAED
— Selected Area Electron Diffraction
AES
— Auger Electron Spectroscopy
AAS
— Atomic Absorption Spectroscopy
TIRFM
— Total Internal Reflection Fluorescence Microscopy
SEC
— Size Exclusion Chromatography
EBIC
— Electron Beam-induced Current
ESR
— Electron Spin Resonance
CBED
— convergent beam electron diffraction patterns
EXSY
— Exchange Spectroscopy
BRET
— Bioluminescence Resonance Energy Transfer
EPR
— Electron Paramagnetic Resonance
SEIRA
— Surface Enhanced Infrared Absorption Spectroscopy
TGA
— Thermogravimetric Analysis
LALLS
— Low-Angle Laser Light Scattering
ATR
— Attenuated Total Reflectance
CARS
— Coherent Anti-Stokes Raman Spectroscopy
DLS
— Dynamic Light Scattering
SPM
— Scanning Probe Microscopy
AFM
— Atomic Force Microscopy
NOESY
— Nuclear Overhauser Effect Spectroscopy
CDI
— Coherent Diffraction Imaging
RIXS
— Resonant Inelastic X-ray Scattering
ERT
— Electrical Resistivity Tomography
XPS
— X-Ray Photoelectron Spectroscopy
DTA
— Differential Thermal Analysis
AFS
— Atomic Fluorescence Spectroscopy
DIC
— Differential Interference Contrast
DVS
— Dynamic Vapour Sorption
MFM
— Magnetic Force Microscopy
EDAX
— energy dispersive analysis of X-rays
WAXS
— wide-angle X-ray scattering
MPS
— Material Processing Satellite
SSNMR
— Solid-State Nuclear Magnetic Resonance
CRYO-EM
— Cryo-electron microscopy
NEXAFS
— Near-Edge X-ray Absorption Fine Structure
CL
— Cathodoluminescence
EELS
— Electron Energy Loss Spectroscopy
FCS
— Fluorescence Correlation Spectroscopy
APS
— Appearance Potential Spectroscopy
PACT
— Photoacoustic Computed Tomography
ESCA
— photoelectron spectroscopy for chemical analysis
ELS
— Electrophoretic Light Scattering
OBIC
— Optical Beam Induced Current
SAM
— Scanning Auger Microscopy
PAS
— Positron Annihilation Spectroscopy
TMA
— Thermomechanical Analysis
AED
— Auger Electron Diffraction
WDX
— Wavelength Dispersive X-Ray Spectroscopy
STEM
— Storable Tubular Extendible Member
SAD
— Selected Area Diffraction
CLSM
— Confocal Laser Scanning Microscopy
LEED
— Low-energy Electron Diffraction
APFIM
— Atom Probe Field Ion Microscopy
MSF
— Materials Science Forum
JMSMM
— Journal of Materials Science Materials in Medicine
JPMAT
— Journal of Porous Materials
EDX
— Energy-Dispersive X-ray Analysis
NSOM
— Near-Field Optical Microscopy
STM
— Scanning Tunneling Microscopy
PES
— Photoelectron Spectroscopy
JNR
— Journal of Nanoparticle Research
MALDI
— Matrix-assisted laser desorption/ionization
NAA
— Neutron Activation Analysis
DHVA
— de Haas van Alphen
JMSP
— Journal of Materials Synthesis and Processing
PIXE
— Proton Induced X-Ray Spectroscopy
SEM
— Sionscanning Electron Microscopy
ESTM
— Electrochemical Scanning Tunneling Microscopy
XRR
— X-ray Reflectivity
SANS
— Small-Angle Neutron Scattering
BIFC
— Bimolecular Fluorescence Complementation
MERL
— Materials Engineering Research Laboratory
FCCS
— fluorescence cross-correlation spectroscopy
PDEIS
— Potentiodynamic Electrochemical Impedance Spectroscopy
ISS
— Ion Scattering Spectroscopy
LEEM
— Low-energy Electron Microscopy
DMA
— Dynamic Mechanical Analysis (for Elastomers)
SIMS
— Secondary Ion Mass Spectrometry
ESD
— Electron-Stimulated Desorption
EPMA
— Electron Probe Microanalysis
LC-MS
— Liquid Chromotography with Mass Spectrometry
MAAB
— Materials Application Advisory Board
SICM
— Scanning Ion Conductance Microscopy
PAX
— Photoemission Of Adsorbed Xenon
MCVP
— Materials Control and Verification Program
COSY
— Correlation Spectroscopy
TXRF
— Total Reflection X-ray Fluorescence Analysis
SURSR
— Surface Science Reports
CAICISS
— Coaxial Impact Collision Ion Scattering Spectroscopy
CV
— Cyclic Voltammetry
DLTS
— Deep-Level Transient Spectroscopy
MCP
— Materials Chemistry and Physics
ESI-MS
— electrospray ionization mass spectrometry
XAS
— X-Ray Absorption Spectroscopy
NANOVID MICROSCOPY
— Nanovid Microscopy
OES
— Optical Emission Spectroscopy
RAMAN
— Raman Spectroscopy
RR
— resonance Raman
SE
— Spectroscopic Ellipsometry
SERS
— Surface-Enhanced Raman Spectroscopy
ACERS
— American Ceramic Society
EL
— electroluminescence
ND
— Neutron Diffraction
XPEEM
— X-Ray Photoelectron Emission Microscopy
MPS&P
— material processing specifications and procedures
EXAFS
— Extended X-Ray Absorption Fine Structure
ODNMR
— Optically Detected Magnetic Resonance
AXRS
— Anomalous X-Ray Scattering
FIM-AP
— Field Ion Microscopy - Atom Probe
SRM-CE/MS
— Selected-Reaction-Monitoring Capillary-Electrophoresis Mass-Spectrometry
MMP
— Materials and Manufacturing Processes
UPS
— UV Photoelectron Spectroscopy
PAT
— Photoacoustic Tomography
XDS
— X-Ray Diffuse Scattering
BSED
— Back Scattered Electron Diffraction
PL
— Photo Luminescence
LOES
— Laser-Optical Emission Spectroscopy
ECT
— Electrical Capacitance Tomography
EDX
— energy-dispersive X-ray spectrometry
SNOM
— Scanning Nearfield Optical Microscopy
PEELS
— Parallel Electron Energy Loss Spectroscopy
IVEM
— Intermediate Voltage Electron Microscopy
RAXRS
— Resonant Anomalous X-Ray Scattering
ACPT
— Advanced Composite Products & Technology
SCEM
— Scanning Confocal Electron Microscopy
FIB
— Focused Ion Beam
MSTEC
— Materials Science and Technology
XRS
— X-ray Raman scattering
EDMR
— Electrically Detected Magnetic Resonance
MAB
— Materials Applications Board
NIMS
— National Institute for Materials Science
CET
— Cryo-Electron Tomography
QENS
— Quasielastic Neutron Scattering
SMW
— Standard Materials Worksheet
ASTM
— American Society for Testing of Materials
MAB
— Materials Advisory Board
XAES
— X-Ray Induced Auger Electron Spectroscopy
LEIS
— Low-Energy Ion-Scattering
MATTR
— Materials Transactions
MIB
— Materials and systems Institute of Bordeaux
PCS
— Photocurrent Spectroscopy
BKD
— Backscatter Kikuchi Diffraction
PED
— Photoelectron Diffraction
STS
— Scanning Tunneling Microscopy
MTA
— Microthermal Analysis
PIXE
— Particle Induced X-Ray Spectroscopy
SCANIIR
— Surface Composition By Analysis Of Neutral Species And Ion-Impact Radiation
EID
— Electron-Induced Desorption
SAXS
— Small Angle Xray Scattering
ECOSY
— Exclusive Correlation Spectroscopy
TACT
— Thermoacoustic Computed Tomography
LIBS
— Laser-Induced Breakdown Spectroscopy
NDTE
— Nondestructive Testing and Evaluation
NDTE
— Nondestructive Test Equipment
REM
— Reflection Electron Microscopy
WDS
— Wavelength-Dispersive Spectroscopy
PC
— Photocurrent
XSW
— X-Ray Standing Wave Technique
ES-MS
— electrospray mass spectrometry
NIS
— Nuclear Inelastic Scattering
VEDIC
— Video-Enhanced Differential Interference Contrast Microscopy
SURIA
— Surface and Interface Analysis
FEM
— Field-Emission Microscopy
SEXAFS
— Surface Extended X-Ray Absorption Fine Structure
PTMS
— Photothermal Microspectroscopy
IRS
— Infrared Spectroscopy
KIM
— Korean Institute of Metals and Materials
MSENG
— Materials Science and Engineering
PD
— Photodesorption
EFTEM
— Energy-filtered Transmission Electron Microscopy
ESEM
— Environmental Scanning Electron Microscopy
MWN
— Materials World Network
SNMS
— Sputtered Neutral Species Mass Spectroscopy
NMAB
— National Materials Advisory Board
TAT
— Thermoacoustic Tomography
VEM
— Viscoelastic Material
SMPM
— Structural Materials Property Manual
SURVL
— Surface Reviews and Letters
CCM
— Charge Collection Microscopy
NDP
— Neutron Department Profiling
RHEED
— Reflection High-energy Electron Diffraction
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