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Materials science
Scientific & Educational
>> Materials science Abbreviations
Look through 184 acronyms and abbreviations related to Materials science:
MEIS
— Medium Energy Ion Scattering
X-CTR
— X-Ray Crystal Truncation Rod Scattering
DSC
— Differential Scanning Calorimetry
SAED
— Selected Area Electron Diffraction
AAS
— Atomic Absorption Spectroscopy
AES
— Auger Electron Spectroscopy
TIRFM
— Total Internal Reflection Fluorescence Microscopy
EBIC
— Electron Beam-induced Current
SEC
— Size Exclusion Chromatography
EXSY
— Exchange Spectroscopy
SEIRA
— Surface Enhanced Infrared Absorption Spectroscopy
ESR
— Electron Spin Resonance
EPR
— Electron Paramagnetic Resonance
CBED
— convergent beam electron diffraction patterns
BRET
— Bioluminescence Resonance Energy Transfer
TGA
— Thermogravimetric Analysis
CARS
— Coherent Anti-Stokes Raman Spectroscopy
LALLS
— Low-Angle Laser Light Scattering
ATR
— Attenuated Total Reflectance
DLS
— Dynamic Light Scattering
NOESY
— Nuclear Overhauser Effect Spectroscopy
AFM
— Atomic Force Microscopy
RIXS
— Resonant Inelastic X-ray Scattering
SPM
— Scanning Probe Microscopy
CDI
— Coherent Diffraction Imaging
XPS
— X-Ray Photoelectron Spectroscopy
ERT
— Electrical Resistivity Tomography
AFS
— Atomic Fluorescence Spectroscopy
DTA
— Differential Thermal Analysis
DIC
— Differential Interference Contrast
WAXS
— wide-angle X-ray scattering
EDAX
— energy dispersive analysis of X-rays
MFM
— Magnetic Force Microscopy
SSNMR
— Solid-State Nuclear Magnetic Resonance
DVS
— Dynamic Vapour Sorption
NEXAFS
— Near-Edge X-ray Absorption Fine Structure
CRYO-EM
— Cryo-electron microscopy
EELS
— Electron Energy Loss Spectroscopy
ESCA
— photoelectron spectroscopy for chemical analysis
MPS
— Material Processing Satellite
CL
— Cathodoluminescence
PACT
— Photoacoustic Computed Tomography
FCS
— Fluorescence Correlation Spectroscopy
ELS
— Electrophoretic Light Scattering
CLSM
— Confocal Laser Scanning Microscopy
NAA
— Neutron Activation Analysis
EDX
— Energy-Dispersive X-ray Analysis
APS
— Appearance Potential Spectroscopy
STEM
— Storable Tubular Extendible Member
PAS
— Positron Annihilation Spectroscopy
OBIC
— Optical Beam Induced Current
JNR
— Journal of Nanoparticle Research
LEED
— Low-energy Electron Diffraction
STM
— Scanning Tunneling Microscopy
APFIM
— Atom Probe Field Ion Microscopy
MSF
— Materials Science Forum
SAM
— Scanning Auger Microscopy
PES
— Photoelectron Spectroscopy
ISS
— Ion Scattering Spectroscopy
JMSMM
— Journal of Materials Science Materials in Medicine
SAD
— Selected Area Diffraction
WDX
— Wavelength Dispersive X-Ray Spectroscopy
PIXE
— Proton Induced X-Ray Spectroscopy
JPMAT
— Journal of Porous Materials
MALDI
— Matrix-assisted laser desorption/ionization
AED
— Auger Electron Diffraction
TMA
— Thermomechanical Analysis
NSOM
— Near-Field Optical Microscopy
DHVA
— de Haas van Alphen
XRR
— X-ray Reflectivity
MERL
— Materials Engineering Research Laboratory
JMSP
— Journal of Materials Synthesis and Processing
SICM
— Scanning Ion Conductance Microscopy
SANS
— Small-Angle Neutron Scattering
PDEIS
— Potentiodynamic Electrochemical Impedance Spectroscopy
SIMS
— Secondary Ion Mass Spectrometry
SEM
— Sionscanning Electron Microscopy
ESTM
— Electrochemical Scanning Tunneling Microscopy
LC-MS
— Liquid Chromotography with Mass Spectrometry
MCP
— Materials Chemistry and Physics
DMA
— Dynamic Mechanical Analysis (for Elastomers)
FCCS
— fluorescence cross-correlation spectroscopy
MAAB
— Materials Application Advisory Board
MCVP
— Materials Control and Verification Program
LEEM
— Low-energy Electron Microscopy
DLTS
— Deep-Level Transient Spectroscopy
CAICISS
— Coaxial Impact Collision Ion Scattering Spectroscopy
SURSR
— Surface Science Reports
EPMA
— Electron Probe Microanalysis
COSY
— Correlation Spectroscopy
ESD
— Electron-Stimulated Desorption
BIFC
— Bimolecular Fluorescence Complementation
XAS
— X-Ray Absorption Spectroscopy
MPS&P
— material processing specifications and procedures
PAX
— Photoemission Of Adsorbed Xenon
TXRF
— Total Reflection X-ray Fluorescence Analysis
LEIS
— Low-Energy Ion-Scattering
ESI-MS
— electrospray ionization mass spectrometry
NANOVID MICROSCOPY
— Nanovid Microscopy
SERS
— Surface-Enhanced Raman Spectroscopy
CV
— Cyclic Voltammetry
XPEEM
— X-Ray Photoelectron Emission Microscopy
RAMAN
— Raman Spectroscopy
ACERS
— American Ceramic Society
EDX
— energy-dispersive X-ray spectrometry
XDS
— X-Ray Diffuse Scattering
EXAFS
— Extended X-Ray Absorption Fine Structure
QENS
— Quasielastic Neutron Scattering
ND
— Neutron Diffraction
RR
— resonance Raman
ODNMR
— Optically Detected Magnetic Resonance
SE
— Spectroscopic Ellipsometry
XAES
— X-Ray Induced Auger Electron Spectroscopy
OES
— Optical Emission Spectroscopy
FIM-AP
— Field Ion Microscopy - Atom Probe
RAXRS
— Resonant Anomalous X-Ray Scattering
LOES
— Laser-Optical Emission Spectroscopy
ECT
— Electrical Capacitance Tomography
SNOM
— Scanning Nearfield Optical Microscopy
PL
— Photo Luminescence
PEELS
— Parallel Electron Energy Loss Spectroscopy
EDMR
— Electrically Detected Magnetic Resonance
SRM-CE/MS
— Selected-Reaction-Monitoring Capillary-Electrophoresis Mass-Spectrometry
MMP
— Materials and Manufacturing Processes
UPS
— UV Photoelectron Spectroscopy
EL
— electroluminescence
SCEM
— Scanning Confocal Electron Microscopy
SCANIIR
— Surface Composition By Analysis Of Neutral Species And Ion-Impact Radiation
MSTEC
— Materials Science and Technology
PAT
— Photoacoustic Tomography
XRS
— X-ray Raman scattering
AXRS
— Anomalous X-Ray Scattering
NIMS
— National Institute for Materials Science
FIB
— Focused Ion Beam
IVEM
— Intermediate Voltage Electron Microscopy
STS
— Scanning Tunneling Microscopy
BSED
— Back Scattered Electron Diffraction
CET
— Cryo-Electron Tomography
PED
— Photoelectron Diffraction
NDTE
— Nondestructive Test Equipment
MAB
— Materials Applications Board
MATTR
— Materials Transactions
NDTE
— Nondestructive Testing and Evaluation
SAXS
— Small Angle Xray Scattering
PCS
— Photocurrent Spectroscopy
ACPT
— Advanced Composite Products & Technology
MAB
— Materials Advisory Board
PTMS
— Photothermal Microspectroscopy
MIB
— Materials and systems Institute of Bordeaux
ASTM
— American Society for Testing of Materials
PIXE
— Particle Induced X-Ray Spectroscopy
EID
— Electron-Induced Desorption
FEM
— Field-Emission Microscopy
WDS
— Wavelength-Dispersive Spectroscopy
XSW
— X-Ray Standing Wave Technique
RHEED
— Reflection High-energy Electron Diffraction
BKD
— Backscatter Kikuchi Diffraction
REM
— Reflection Electron Microscopy
SEXAFS
— Surface Extended X-Ray Absorption Fine Structure
TACT
— Thermoacoustic Computed Tomography
SMW
— Standard Materials Worksheet
MTA
— Microthermal Analysis
SNMS
— Sputtered Neutral Species Mass Spectroscopy
LIBS
— Laser-Induced Breakdown Spectroscopy
NIS
— Nuclear Inelastic Scattering
MWN
— Materials World Network
KIM
— Korean Institute of Metals and Materials
PC
— Photocurrent
IRS
— Infrared Spectroscopy
SURIA
— Surface and Interface Analysis
ECOSY
— Exclusive Correlation Spectroscopy
MSENG
— Materials Science and Engineering
NMAB
— National Materials Advisory Board
VEM
— Viscoelastic Material
ES-MS
— electrospray mass spectrometry
VEDIC
— Video-Enhanced Differential Interference Contrast Microscopy
NDP
— Neutron Department Profiling
TAT
— Thermoacoustic Tomography
PD
— Photodesorption
SURVL
— Surface Reviews and Letters
CCM
— Charge Collection Microscopy
SMPM
— Structural Materials Property Manual
EFTEM
— Energy-filtered Transmission Electron Microscopy
ESEM
— Environmental Scanning Electron Microscopy
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