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Microscopy
Scientific & Educational
>> Microscopy Abbreviations
Look through 157 acronyms and abbreviations related to Microscopy:
MEIS
— Medium Energy Ion Scattering
X-CTR
— X-Ray Crystal Truncation Rod Scattering
DSC
— Differential Scanning Calorimetry
C-AFM
— Conductive Atomic Force Microscopy
SAED
— Selected Area Electron Diffraction
AES
— Auger Electron Spectroscopy
AAS
— Atomic Absorption Spectroscopy
TIRFM
— Total Internal Reflection Fluorescence Microscopy
SEC
— Size Exclusion Chromatography
EBIC
— Electron Beam-induced Current
ESR
— Electron Spin Resonance
CBED
— convergent beam electron diffraction patterns
EXSY
— Exchange Spectroscopy
BRET
— Bioluminescence Resonance Energy Transfer
SEIRA
— Surface Enhanced Infrared Absorption Spectroscopy
EPR
— Electron Paramagnetic Resonance
TGA
— Thermogravimetric Analysis
LALLS
— Low-Angle Laser Light Scattering
ATR
— Attenuated Total Reflectance
CARS
— Coherent Anti-Stokes Raman Spectroscopy
DLS
— Dynamic Light Scattering
SPM
— Scanning Probe Microscopy
NOESY
— Nuclear Overhauser Effect Spectroscopy
AFM
— Atomic Force Microscopy
CDI
— Coherent Diffraction Imaging
RIXS
— Resonant Inelastic X-ray Scattering
ERT
— Electrical Resistivity Tomography
XPS
— X-Ray Photoelectron Spectroscopy
DTA
— Differential Thermal Analysis
AFS
— Atomic Fluorescence Spectroscopy
DIC
— Differential Interference Contrast
DVS
— Dynamic Vapour Sorption
MFM
— Magnetic Force Microscopy
EDAX
— energy dispersive analysis of X-rays
WAXS
— wide-angle X-ray scattering
SSNMR
— Solid-State Nuclear Magnetic Resonance
CRYO-EM
— Cryo-electron microscopy
NEXAFS
— Near-Edge X-ray Absorption Fine Structure
CL
— Cathodoluminescence
EELS
— Electron Energy Loss Spectroscopy
FCS
— Fluorescence Correlation Spectroscopy
APS
— Appearance Potential Spectroscopy
PACT
— Photoacoustic Computed Tomography
ELS
— Electrophoretic Light Scattering
ESCA
— photoelectron spectroscopy for chemical analysis
OBIC
— Optical Beam Induced Current
SAM
— Scanning Auger Microscopy
PAS
— Positron Annihilation Spectroscopy
AED
— Auger Electron Diffraction
TMA
— Thermomechanical Analysis
STEM
— Storable Tubular Extendible Member
WDX
— Wavelength Dispersive X-Ray Spectroscopy
CLSM
— Confocal Laser Scanning Microscopy
SAD
— Selected Area Diffraction
LEED
— Low-energy Electron Diffraction
APFIM
— Atom Probe Field Ion Microscopy
EDX
— Energy-Dispersive X-ray Analysis
STM
— Scanning Tunneling Microscopy
NSOM
— Near-Field Optical Microscopy
PES
— Photoelectron Spectroscopy
NAA
— Neutron Activation Analysis
MALDI
— Matrix-assisted laser desorption/ionization
DHVA
— de Haas van Alphen
SEM
— Sionscanning Electron Microscopy
PIXE
— Proton Induced X-Ray Spectroscopy
ESTM
— Electrochemical Scanning Tunneling Microscopy
XRR
— X-ray Reflectivity
SANS
— Small-Angle Neutron Scattering
BIFC
— Bimolecular Fluorescence Complementation
PDEIS
— Potentiodynamic Electrochemical Impedance Spectroscopy
LEEM
— Low-energy Electron Microscopy
ISS
— Ion Scattering Spectroscopy
FCCS
— fluorescence cross-correlation spectroscopy
ESD
— Electron-Stimulated Desorption
SIMS
— Secondary Ion Mass Spectrometry
DMA
— Dynamic Mechanical Analysis (for Elastomers)
EPMA
— Electron Probe Microanalysis
LC-MS
— Liquid Chromotography with Mass Spectrometry
SICM
— Scanning Ion Conductance Microscopy
PAX
— Photoemission Of Adsorbed Xenon
TXRF
— Total Reflection X-ray Fluorescence Analysis
COSY
— Correlation Spectroscopy
CAICISS
— Coaxial Impact Collision Ion Scattering Spectroscopy
DLTS
— Deep-Level Transient Spectroscopy
ESI-MS
— electrospray ionization mass spectrometry
CV
— Cyclic Voltammetry
XAS
— X-Ray Absorption Spectroscopy
NANOVID MICROSCOPY
— Nanovid Microscopy
OES
— Optical Emission Spectroscopy
RAMAN
— Raman Spectroscopy
SERS
— Surface-Enhanced Raman Spectroscopy
SE
— Spectroscopic Ellipsometry
RR
— resonance Raman
ND
— Neutron Diffraction
EL
— electroluminescence
XPEEM
— X-Ray Photoelectron Emission Microscopy
EXAFS
— Extended X-Ray Absorption Fine Structure
ODNMR
— Optically Detected Magnetic Resonance
AXRS
— Anomalous X-Ray Scattering
PAT
— Photoacoustic Tomography
XDS
— X-Ray Diffuse Scattering
UPS
— UV Photoelectron Spectroscopy
BSED
— Back Scattered Electron Diffraction
FIM-AP
— Field Ion Microscopy - Atom Probe
SRM-CE/MS
— Selected-Reaction-Monitoring Capillary-Electrophoresis Mass-Spectrometry
PL
— Photo Luminescence
ECT
— Electrical Capacitance Tomography
SNOM
— Scanning Nearfield Optical Microscopy
EDX
— energy-dispersive X-ray spectrometry
PEELS
— Parallel Electron Energy Loss Spectroscopy
LOES
— Laser-Optical Emission Spectroscopy
RAXRS
— Resonant Anomalous X-Ray Scattering
SCEM
— Scanning Confocal Electron Microscopy
FIB
— Focused Ion Beam
IVEM
— Intermediate Voltage Electron Microscopy
XRS
— X-ray Raman scattering
EDMR
— Electrically Detected Magnetic Resonance
QENS
— Quasielastic Neutron Scattering
XAES
— X-Ray Induced Auger Electron Spectroscopy
CET
— Cryo-Electron Tomography
LEIS
— Low-Energy Ion-Scattering
BKD
— Backscatter Kikuchi Diffraction
PCS
— Photocurrent Spectroscopy
PED
— Photoelectron Diffraction
MTA
— Microthermal Analysis
PEM
— Photo Emission Microscopy
SCANIIR
— Surface Composition By Analysis Of Neutral Species And Ion-Impact Radiation
PIXE
— Particle Induced X-Ray Spectroscopy
EID
— Electron-Induced Desorption
STS
— Scanning Tunneling Microscopy
LIBS
— Laser-Induced Breakdown Spectroscopy
REM
— Reflection Electron Microscopy
LSM
— Laser Scan Microscopy
SAXS
— Small Angle Xray Scattering
TACT
— Thermoacoustic Computed Tomography
ECOSY
— Exclusive Correlation Spectroscopy
XSW
— X-Ray Standing Wave Technique
ES-MS
— electrospray mass spectrometry
PC
— Photocurrent
NIS
— Nuclear Inelastic Scattering
SCM
— Scanning Capacitance Microscopy
WDS
— Wavelength-Dispersive Spectroscopy
IRS
— Infrared Spectroscopy
PTMS
— Photothermal Microspectroscopy
FEM
— Field-Emission Microscopy
VEDIC
— Video-Enhanced Differential Interference Contrast Microscopy
SEXAFS
— Surface Extended X-Ray Absorption Fine Structure
MM
— Magnetic Microscopy
EFTEM
— Energy-filtered Transmission Electron Microscopy
PD
— Photodesorption
TAT
— Thermoacoustic Tomography
SAM
— Scanning Acoustic Microscopy
ESEM
— Environmental Scanning Electron Microscopy
CCM
— Charge Collection Microscopy
SNMS
— Sputtered Neutral Species Mass Spectroscopy
NDP
— Neutron Department Profiling
RHEED
— Reflection High-energy Electron Diffraction
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