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Materials science
Scientific & Educational
>> Materials science Abbreviations
Look through 184 acronyms and abbreviations related to Materials science:
X-CTR
— X-Ray Crystal Truncation Rod Scattering
DSC
— Differential Scanning Calorimetry
SAED
— Selected Area Electron Diffraction
MEIS
— Medium Energy Ion Scattering
AES
— Auger Electron Spectroscopy
EXSY
— Exchange Spectroscopy
NOESY
— Nuclear Overhauser Effect Spectroscopy
AFS
— Atomic Fluorescence Spectroscopy
AAS
— Atomic Absorption Spectroscopy
DLS
— Dynamic Light Scattering
EPR
— Electron Paramagnetic Resonance
ESR
— Electron Spin Resonance
CARS
— Coherent Anti-Stokes Raman Spectroscopy
AFM
— Atomic Force Microscopy
CLSM
— Confocal Laser Scanning Microscopy
SEIRA
— Surface Enhanced Infrared Absorption Spectroscopy
DTA
— Differential Thermal Analysis
RIXS
— Resonant Inelastic X-ray Scattering
STM
— Scanning Tunneling Microscopy
LALLS
— Low-Angle Laser Light Scattering
TGA
— Thermogravimetric Analysis
EDX
— Energy-Dispersive X-ray Analysis
SEC
— Size Exclusion Chromatography
EELS
— Electron Energy Loss Spectroscopy
SSNMR
— Solid-State Nuclear Magnetic Resonance
EBIC
— Electron Beam-induced Current
ATR
— Attenuated Total Reflectance
ESCA
— photoelectron spectroscopy for chemical analysis
FCS
— Fluorescence Correlation Spectroscopy
REM
— Reflection Electron Microscopy
WAXS
— wide-angle X-ray scattering
DLTS
— Deep-Level Transient Spectroscopy
XPS
— X-Ray Photoelectron Spectroscopy
ERT
— Electrical Resistivity Tomography
ESI-MS
— electrospray ionization mass spectrometry
MSF
— Materials Science Forum
TIRFM
— Total Internal Reflection Fluorescence Microscopy
CBED
— convergent beam electron diffraction patterns
PAS
— Positron Annihilation Spectroscopy
MALDI
— Matrix-assisted laser desorption/ionization
CDI
— Coherent Diffraction Imaging
SANS
— Small-Angle Neutron Scattering
JMSP
— Journal of Materials Synthesis and Processing
STEM
— Storable Tubular Extendible Member
EDAX
— energy dispersive analysis of X-rays
NAA
— Neutron Activation Analysis
BRET
— Bioluminescence Resonance Energy Transfer
LC-MS
— Liquid Chromotography with Mass Spectrometry
ELS
— Electrophoretic Light Scattering
DIC
— Differential Interference Contrast
XRR
— X-ray Reflectivity
JMSMM
— Journal of Materials Science Materials in Medicine
JNR
— Journal of Nanoparticle Research
PACT
— Photoacoustic Computed Tomography
SIMS
— Secondary Ion Mass Spectrometry
EDX
— energy-dispersive X-ray spectrometry
PES
— Photoelectron Spectroscopy
JPMAT
— Journal of Porous Materials
LEED
— Low-energy Electron Diffraction
ISS
— Ion Scattering Spectroscopy
MERL
— Materials Engineering Research Laboratory
PDEIS
— Potentiodynamic Electrochemical Impedance Spectroscopy
DMA
— Dynamic Mechanical Analysis (for Elastomers)
NEXAFS
— Near-Edge X-ray Absorption Fine Structure
WDX
— Wavelength Dispersive X-Ray Spectroscopy
MAAB
— Materials Application Advisory Board
APS
— Appearance Potential Spectroscopy
MCVP
— Materials Control and Verification Program
MPS&P
— material processing specifications and procedures
OBIC
— Optical Beam Induced Current
SPM
— Scanning Probe Microscopy
XRS
— X-ray Raman scattering
DVS
— Dynamic Vapour Sorption
NSOM
— Near-Field Optical Microscopy
ESEM
— Environmental Scanning Electron Microscopy
RAMAN
— Raman Spectroscopy
SAM
— Scanning Auger Microscopy
APFIM
— Atom Probe Field Ion Microscopy
SEM
— Sionscanning Electron Microscopy
PIXE
— Proton Induced X-Ray Spectroscopy
SCEM
— Scanning Confocal Electron Microscopy
LEIS
— Low-Energy Ion-Scattering
TXRF
— Total Reflection X-ray Fluorescence Analysis
LEEM
— Low-energy Electron Microscopy
ESTM
— Electrochemical Scanning Tunneling Microscopy
SRM-CE/MS
— Selected-Reaction-Monitoring Capillary-Electrophoresis Mass-Spectrometry
SICM
— Scanning Ion Conductance Microscopy
MFM
— Magnetic Force Microscopy
CRYO-EM
— Cryo-electron microscopy
RHEED
— Reflection High-energy Electron Diffraction
MPS
— Material Processing Satellite
XAS
— X-Ray Absorption Spectroscopy
DHVA
— de Haas van Alphen
EFTEM
— Energy-filtered Transmission Electron Microscopy
BKD
— Backscatter Kikuchi Diffraction
AED
— Auger Electron Diffraction
XDS
— X-Ray Diffuse Scattering
AXRS
— Anomalous X-Ray Scattering
BIFC
— Bimolecular Fluorescence Complementation
EDMR
— Electrically Detected Magnetic Resonance
COSY
— Correlation Spectroscopy
TACT
— Thermoacoustic Computed Tomography
EXAFS
— Extended X-Ray Absorption Fine Structure
MMP
— Materials and Manufacturing Processes
PCS
— Photocurrent Spectroscopy
PAT
— Photoacoustic Tomography
ACERS
— American Ceramic Society
XPEEM
— X-Ray Photoelectron Emission Microscopy
SAD
— Selected Area Diffraction
RAXRS
— Resonant Anomalous X-Ray Scattering
CL
— Cathodoluminescence
ECOSY
— Exclusive Correlation Spectroscopy
MCP
— Materials Chemistry and Physics
MSTEC
— Materials Science and Technology
ECT
— Electrical Capacitance Tomography
FIB
— Focused Ion Beam
XAES
— X-Ray Induced Auger Electron Spectroscopy
EPMA
— Electron Probe Microanalysis
QENS
— Quasielastic Neutron Scattering
STS
— Scanning Tunneling Microscopy
LOES
— Laser-Optical Emission Spectroscopy
PEELS
— Parallel Electron Energy Loss Spectroscopy
SERS
— Surface-Enhanced Raman Spectroscopy
SURSR
— Surface Science Reports
TMA
— Thermomechanical Analysis
NANOVID MICROSCOPY
— Nanovid Microscopy
FCCS
— fluorescence cross-correlation spectroscopy
ESD
— Electron-Stimulated Desorption
ND
— Neutron Diffraction
SNOM
— Scanning Nearfield Optical Microscopy
FIM-AP
— Field Ion Microscopy - Atom Probe
SE
— Spectroscopic Ellipsometry
EID
— Electron-Induced Desorption
CAICISS
— Coaxial Impact Collision Ion Scattering Spectroscopy
CV
— Cyclic Voltammetry
CCM
— Charge Collection Microscopy
OES
— Optical Emission Spectroscopy
UPS
— UV Photoelectron Spectroscopy
BSED
— Back Scattered Electron Diffraction
MWN
— Materials World Network
SAXS
— Small Angle Xray Scattering
ACPT
— Advanced Composite Products & Technology
ES-MS
— electrospray mass spectrometry
IVEM
— Intermediate Voltage Electron Microscopy
SEXAFS
— Surface Extended X-Ray Absorption Fine Structure
PAX
— Photoemission Of Adsorbed Xenon
ODNMR
— Optically Detected Magnetic Resonance
PL
— Photo Luminescence
NDTE
— Nondestructive Testing and Evaluation
CET
— Cryo-Electron Tomography
MATTR
— Materials Transactions
NIS
— Nuclear Inelastic Scattering
NIMS
— National Institute for Materials Science
IRS
— Infrared Spectroscopy
SURIA
— Surface and Interface Analysis
LIBS
— Laser-Induced Breakdown Spectroscopy
SMPM
— Structural Materials Property Manual
SCANIIR
— Surface Composition By Analysis Of Neutral Species And Ion-Impact Radiation
PED
— Photoelectron Diffraction
PIXE
— Particle Induced X-Ray Spectroscopy
WDS
— Wavelength-Dispersive Spectroscopy
VEDIC
— Video-Enhanced Differential Interference Contrast Microscopy
NDP
— Neutron Department Profiling
ASTM
— American Society for Testing of Materials
MIB
— Materials and systems Institute of Bordeaux
RR
— resonance Raman
PC
— Photocurrent
XSW
— X-Ray Standing Wave Technique
NDTE
— Nondestructive Test Equipment
SNMS
— Sputtered Neutral Species Mass Spectroscopy
MAB
— Materials Advisory Board
MSENG
— Materials Science and Engineering
SURVL
— Surface Reviews and Letters
VEM
— Viscoelastic Material
MAB
— Materials Applications Board
MTA
— Microthermal Analysis
FEM
— Field-Emission Microscopy
KIM
— Korean Institute of Metals and Materials
EL
— electroluminescence
SMW
— Standard Materials Worksheet
TAT
— Thermoacoustic Tomography
PTMS
— Photothermal Microspectroscopy
NMAB
— National Materials Advisory Board
PD
— Photodesorption
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